Éditeur(s) : HAL CCSD Institute of Electrical and Electronics Engineers
Résumé : International audience
ISSN: 0018-9499

hal-01635490
https://hal.archives-ouvertes.fr/hal-01635490
DOI : 10.1109/TNS.2014.2365048

Éditeur(s) : HAL CCSD IOP Publishing
Résumé : Radioactive pollutants are naturally present in microelectronic device materials and can be an issue for the reliability of devices. The main concern is alpha emitters that produce high-energy particles (a few MeV) that ionize the semiconductor and then trigger soft errors. The question is to know what kinds of radionuclides are present in the device, their location in the device and the abundance of each species. In this paper we describe tools that are required to address the issue of radioactive pollutants in electronic devices.
ISSN: 0268-1242

hal-01504448
https://hal.archives-ouvertes.fr/hal-01504448
DOI : 10.1088/1361-6641/aa5479

Éditeur(s) : HAL CCSD Institute of Electrical and Electronics Engineers
Résumé : International audience
ISSN: 0018-9499

hal-01635482
https://hal.archives-ouvertes.fr/hal-01635482
DOI : 10.1109/TNS.2014.2369347

Éditeur(s) : HAL CCSD Institute of Electrical and Electronics Engineers
Résumé : International audience
ISSN: 0018-9499

hal-01633941
https://hal.archives-ouvertes.fr/hal-01633941
DOI : 10.1109/TNS.2013.2280294

Éditeur(s) : HAL CCSD Institute of Electrical and Electronics Engineers
Résumé : International audience
ISSN: 0018-9499

hal-01632372
https://hal.archives-ouvertes.fr/hal-01632372
DOI : 10.1109/TNS.2010.2089063